ANALYTICAL FACILITIES AT THE DEPARTMENT OF GEOLOGICAL MAPPING
Instrumentation

The Deparment of Geological Mapping offers a variety of analytical services and facilities including Computer Controlled Scanning Electron Microscopy (CCSEM), X-Ray Fluorescence Analysis (XRF), and Inductively Coupled Plasma - Mass Spectrometry (ICP-MS, for both liquid and solid sampling), and thin section and sample preparation. Our well-equipped laboratories provide an extensive range of chemical analyses and imaging possibilities for all kinds of geological and non-geological materials.
The laboratories support the principal activities of GEUS in the fields of research, prospecting and resource management. We also provide services to Geocenter research projects and academic collaborators on a fee-for-service basis. Our expertise is also supplied to external customers with analytical and consultancy services covering a wide range of issues including mineralogy, sedimentology, environmental investigations, and raw materials for building.