X-Ray Fluorescence analysis is a method used for rapid, multi-element analysis of bulk samples. Our laboratory is equipped with a Philips PW 1606 wavelength dispersive multichannel XRF spectrometer acquired in 1985. XRF spectrometers can be used to measure virtually every element from Na to Pu in the periodic table and measure elemental concentrations ranging from a few ppm to nearly 100 %. Our XRF spectrometer is specialised in high-precision major-element analysis of silicate rocks; however, because of our unique method of standardisation against synthetic materials, samples of an unusually large range of compositions (e.g., ores, slags, limestones, synthetic compounds) can be analysed with high accuracy.
For all inquiries and for additional information about the WDXRF laboratory contact Jørgen Kystol (email: email@example.com; Tel: 0045-38142675) or Lotte Melchior Larsen (email: firstname.lastname@example.org; Tel: 0045-38142252) or