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ANALYTICAL FACILITIES AT THE DEPARTMENT OF GEOLOGICAL MAPPING

Geological Survey of Denmark and Greenland (GEUS)
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X-Ray Fluorescence (XRF) Laboratory

Jørgen Kystol

X-Ray Fluorescence analysis is a method used for rapid, multi-element analysis of bulk samples. Our laboratory is equipped with a Philips PW 1606 wavelength dispersive multichannel XRF spectrometer acquired in 1985. XRF spectrometers can be used to measure virtually every element from Na to Pu in the periodic table and measure elemental concentrations ranging from a few ppm to nearly 100 %. Our XRF spectrometer is specialised in high-precision major-element analysis of silicate rocks; however, because of our unique method of standardisation against synthetic materials, samples of an unusually large range of compositions (e.g., ores, slags, limestones, synthetic compounds) can be analysed with high accuracy.
All analyses are made on fused glass dics prepared from dried and ignited powdered samples. Elements routinely determined as weight % oxide are SiO2, TiO2, Al2O3, Fe2O3(total), MnO, MgO, CaO, Na2O, K2O, and P2O5. Trace elements determined on reconnaissance basis at the> 50 ppm level are V, Cr, Ni, Cu, Zn, Rb, Sr, Y, Zr, Nb, Mo, Sn, Ba, La, and Ce. If required, the oxidation state of a sample (the 'FeO' content) is measured by dissolution and titration. A detailed description of the method is found in: Kystol, J. & Larsen, L. M. 1999: Analytical procedures in the Rock Geochemical Laboratory of the Geological Survey of Denmark and Greenland. Geology of Greenland Survey Bulletin 184, 59–62.

For all inquiries and for additional information about the WDXRF laboratory contact Jørgen Kystol (email: jk@geus.dk; Tel: 0045-38142675) or Lotte Melchior Larsen (email: lml@geus.dk; Tel: 0045-38142252) or


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