Contact
Nynke Keulen
Mail:
ntk@geus.dk
Telephone: 3814 2251
|
GEUS uses a Philips SL-40 Scanning Electron Microscope (SEM) for the following analyses:
-
Automatic particle analysis (Computer-Controlled Scanning Electron Microscopy, CCSEM) on beach sands, stream sediments, soil samples and sandstones. Other (geological) materials can also be analysed. Contact us for details.
-
Imaging of samples with SE (secondary electrons), BSE (back-scattered electron contrast) and CL (Cathodoluminescence) detectors. SE is used to study the topography and relief in rock fragments and crystals.
-
BSE provides material (mineral) contrasts and is used on polished surfaces and thin sections. CL can be used to reproduce images of different growth stages, especially in silicates.
-
Element mapping of thin sections, EDX (Energy Dispersive X-ray spectrometry) based chemical analyses (major and minor elements).
Key instruments
Scanning Electron Microscope (Philips XL-40) with tungsten filament for SE and BSE imaging. The SEM instrument is equipped with two EDX Si(Li) detectors (Thermo Nanotrace 30 mm2 window and a Pioneer Voyager 2.7 with a 10 mm2 window), and a CL detector. The laboratory also has carbon and gold coating facilities.
Restrictions on access
Training is required before the Scanning Electron Microscope can be used independently. For short projects, the microscope can be booked with assistance.
Prices
Please contact the laboratory for information on prices.
Location
Department of Petrology and Economic Geology, area 3, room 01-372 (basement).
|
Equipment and working processes
Operation of the SEM instrument
SEM set-up
Sample mounted in epoxy ready for
SEM analysis
Overview over til different SEM
analysis techniques
|
